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Reed Switches and Dynamic Contact Resistance

Dynamic contact resistance (DCR) testing plays a critical role in ensuring long-term reed switch reliability. While reed switches appear simple, the act of switching involves complex mechanical and electrical interactions that can lead to premature failure if not properly tested.

Dynamic contact resistance is a “true” test and a way of measuring the contact resistance of reed switches to ensure fault free operation, and maximum switching efficiency.

If there are particular areas you need help with, feel free to skip to any of the following sections:

Introduction

Dynamic contact resistance (DCR) testing plays a critical role in ensuring long-term reed switch reliability. While reed switches appear simple, the act of switching involves complex mechanical and electrical interactions that can lead to premature failure if not properly tested.

DCR testing allows manufacturers to detect hidden defects early, improve switching efficiency, and ensure fault-free operation in demanding applications.

Schematic diagram showing an oscillator (50–200 Hz) connected to a reed switch under test, with a resistor to ground and output for measuring dynamic contact resistance using an oscilloscope; powered at +0.5V, 50 mA. by Standex Detect
A typical circuit used for measuring the dynamic contact resistance across the contacts of a reed switch.

What is Dynamic Contact Resistance Testing?

Dynamic contact resistance is a “true” test and a way of measuring the contact resistance of the reed switch blades. This testing ensures that all tools being utilized are not adversely affecting the reed switch. Furthermore, the test eliminates premature failures and improves long term reliability in the equipment and technical systems.

Why Dynamic Contact Resistance Matters for Reed Switch Reliability

Our typical dynamic contact resistance test consists of operating the reed contacts at about 100 times per second. At that rate, we look for a measurement of the contact resistance about 1 millisecond after the contacts close. If the contacts are clean (meaning no contaminants on the contacts) and the reed switch is intact, we usually get a positive result.

However, if there is the slightest problem, the contact resistance will not have settled down within one millisecond timeframe. Resulting in a rejected or failed reed switch.

A DCR test is the most accurate and efficient way to examine the condition and ability of the reed switch. Additionally, DCR testing helps to determine if anything needs to be corrected during the manufacture of reed switches. 

Line graph showing dynamic contact resistance (in milliohms) versus time (in milliseconds) for reed switches, with labeled points for coil activation, first closure, bounce time, dynamic noise, wavering contacts, and D.C.R. measurement. by Standex Detect
A typical or passing dynamic contact resistance test. The wave pattern shows the first closure, contact bounce, dynamic noise and pattern generated by wavering reed contacts.

Many things can prove to be a disruption in regards to a reed switch’s function. These disruptions listed below can cause a DCR failure:

  • Overstressed reed switch usually from assembly
  • Small crack on the reed seal
  • Broken reed switch
  • Plating or sputtering peeling off the contact area
  • Air contamination in the glass capsule
  • Particles on the reed contacts

What Causes DCR Test Failures?

Below are some examples of electrical patterns showing various DCR failures.

Excessive Contact Bounce

DCR Failure “Excessive Contact Bounce” indicating a weak contact closing force sure to shorten the life of the switch

Line graph showing Dynamic Contact Resistance in milliohms over time in milliseconds, with labeled phases: coil activation, time to first closure, excessive bounce time (highlighted), and dynamic noise in Reed Switches. by Standex Detect
The electrical pattern of a DCR test showing a failure due to excessive contact bounce.

Excessive Dynamic Noise

DCR Failure “Excessive Dynamic Noise” and “Excessive Contact Wavering” both caused by potential stressed or cracked glass switch seal

A line graph shows dynamic contact resistance (milliohms) vs. time (milliseconds) for reed switches. Key events—coil activation, first closure, bounce time, and excessive dynamic noise (highlighted in red)—are labeled; the line oscillates after bounce time. by Standex Detect
A failed dynamic contact resistance test showing excessive dynamic noise.
A line graph shows Dynamic Contact Resistance (in milliohms) vs. time (in milliseconds) for Reed Switches. Labeled phases include coil activation, first closure, bounce, dynamic noise, and a shaded area of excessive wavering contacts. by Standex Detect
A failed dynamic contact resistance test showing excessive contact wavering.

Changing Contact Resistance

DCR Failure “Changing Contact Resistance” caused by contact contamination, seal leak, particles, or peeling plating

Line graph showing dynamic contact resistance (in milliohms) over time (milliseconds) for a relay. Key events, such as coil activation, first closure, bounce time, and dynamic noise, are labeled; resistance changes are highlighted in red. by Standex Detect
A failed dynamic contact resistance test showing contact resistance changing in each successive operation indicating contact contamination.

Key Factors That Affect DCR Test Results

When completing a DCR test, there are a few different factors that will determine the approach of the test that is taken. For example, the test that you run and the results that you get will be based on the below five factors.

1)

Reed Switch Size

Reed switch size has a direct impact on dynamic switching behavior. Larger reed switches have greater inertia and stiffer reed blades, which results in longer initial contact closure times. This increased stiffness also amplifies the effects of contact vibration during switching.

In contrast, smaller reed switches have less inertia and more flexible reed blades, allowing them to close more quickly and with reduced mechanical stress. As a result, smaller reeds typically exhibit shorter closure times and different dynamic characteristics during DCR testing.

2)

Inductance of the Coil

Reed switch size is closely tied to the inductance of the actuating coil. Larger reed switches require magnetically stronger, more inductive coils to initiate contact closure. The inductance of the coil influences how quickly the magnetic field builds and collapses, which directly affects the switching speed and dynamic behavior of the reed contacts.

Variations in coil inductance can significantly influence the measured dynamic contact resistance and must be carefully controlled during testing.

3)

Harmonic Motion

When the reed contacts close, they do so with momentum that causes the reed blades to vibrate. This vibration is known as critically damped harmonic motion and is a key factor in dynamic contact resistance testing.

During this motion, the reeds vibrate microscopically within the glass capsule. The magnitude and duration of this vibration affect contact bounce, dynamic noise, and the stability of the contact resistance measurement.

4)

Applied Voltage

As the reeds vibrate within the magnetic field generated by the coil, their motion induces a small electrical current in the metal. This induced current is an essential component of the DCR measurement.

The applied voltage influences both the magnetic field strength and the resulting induced current, making it a critical parameter in accurately measuring dynamic contact resistance during switching.

5)

Overdrive Level

The overdrive level refers to the voltage or current applied beyond the reed switch’s pull‑in (closure) point. This parameter determines the operating condition under which the DCR measurement is taken.

Proper control of coil overdrive is essential, as insufficient overdrive may lead to inconsistent closure, while excessive overdrive can mask defects or introduce unnecessary mechanical stress. Selecting the correct overdrive level ensures accurate and repeatable DCR test results.

Conclusion: Why 100% DCR Testing Is Essential

Reed switches provide us with a unique ability to utilize opening and closing contacts in virtually any environment with a simple magnet, enabling a large space for switching innovation. Dynamic contact resistance testing is a must in order to ensure a fault free operation, maximum efficiency and continued reed switching innovation. For this reason, Standex Detect DCR tests 100% of our reed-switch based components to ensure its customers get the highest quality and reliability.

Get in touch with our team to learn more about our carefully engineered solutions.

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